Search
Rules for the search
- Only words with 2 or more characters are accepted
- Max 200 chars total
- Space is used to split words, "" can be used to search for a whole string (not indexed search then)
- AND, OR and NOT are prefix words, overruling the default operator
- +/|/- equals AND, OR and NOT as operators.
- All search words are converted to lowercase
UV-C AlGaN photodetectors with cut-off wavelength below 220 nm
/en/research/research-news/uv-c-algan-photodetectors-with-cut-off-wavelength-below-220-nm
In many applications, UV radiation is monitored in a certain wavelength range by photodetectors (PD). We have extended our studies on UV photodetectors to devices that are only sensitive in the lower…
Advanced UV for Life
/en/media-center/media-review/advanced-uv-for-life-1
Introducing a New Optics Consortium for UV sterilizing.
Berlin WideBaSe – Many Results and Good Prospects
/en/media-center/media-review/berlin-widebase-many-results-and-good-prospects
Nitride based UV-LED, detectors, and electronics made in Berlin
AlGaN/GaN HFET Technology at FBH: Fabrication of Power Bars and MMICs
/en/media-center/media-review/algangan-hfet-technology-at-fbh-fabrication-of-power-bars-and-mmics-1
Sergey A. ShevchenkoFerdinand-Braun-Institut, Berlin
K and Q-Band GaN HEMTs for space applications
/en/media-center/media-review/k-and-q-band-gan-hemts-for-space-applications
Konstantin OsipovFerdinand-Braun-Institut, Berlin
FBH at GeMiC 2014
/en/events/fbh-at-gemic-2014
FBH scientists present new research results at the German Microwave Conference.
FBH publication selected as highlight by IOP Science
/en/events/fbh-publication-selected-as-highlight-by-iop-science
The article of Horia Porteanu et.al. published in Plasma Sources Science and Technology last year has been selected by the journal’s Editors as a highlight of 2013.
Addressing the weakness of GaN transistors
/en/media-center/media-review/addressing-the-weakness-of-gan-transistors
Researchers reveal how to slash dynamic resistance, minimise interface traps and identify the origin of current collapse.
UV-B LEDs of high robustness and reliability
/en/research/research-news/uv-b-leds-of-high-robustness-and-reliability
In order to enhance the lifetime of currently available UV-B LEDs, extended stress tests of UV-B LEDs have been started at FBH to study the relevant degradation mechanisms in these devices - with…