A. Rumiantsev1, R. Doerner2, G.N. Phung2
94th ARFTG Microwave Measurement Symposium (ARFTG), San Antonio, USA, Jan. 26-29 (2020).
This work presents the design concept, EM-simulation and measurement results of a new calibration substrate developed to address probe-tip calibration challenges and to improve calibration accuracy at mm-wave frequency range.
1 MPI Corporation, Taiwan
2 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik (FBH), Germany
on-wafer probes, coplanar waveguides (CPW), substrate modes, calibration.
© Copyright 2020 IEEE - All rights reserved. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Full version in pdf-format.