Longitudinal Current Crowding as Power Limit in High Power 975 nm Diode Lasers

R.B. Swertfeger1, S.K. Patra1, R.J. Deri1, M.C. Boisselle1, D.L. Pope1, P.O. Leisher1,2, S. Arslan3, J. Fricke3, A. Ginolas3, C. Stölmacker3, H. Wenzel3 and P.A. Crump3

Published in:

IEEE Photonics Conference (IPC 2020), Vancouver, Canada, Sep. 28 - Oct. 1, Virtual Event, ISBN 978-1-7281-5891-4 (2020).

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Abstract:

Experiment and simulation of high power diode lasers reveals a longitudinally-varying current density profile, due to spatial hole-burning. Current crowding at the front facet increases with cavity length and bias, and limits the achievable power.

1 Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550, USA
2 Now with: Freedom Photonics LLC, 41 Aero Camino, Santa Barbara, CA 91137, USA
3 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany