DRIP-XV
15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors (DRIP)
The DRIP is a conference on physics of semiconductors with special emphasis on defects. It covers application aspects as well as fundamental questions regarding the physics of defects. FBH is involved both in the steering committee and participating with an invited speaker:
- Anna Mogilatenko (FBH Germany): Defect analysis in III-nitride layers using transmission electron microscopy
Conference, 15.-19.09.2013, Warsaw, Poland