DRIP - International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

The DRIP XVIII conference will be held in Berlin, Germany, and is organized by FBH and IKZ.  It covers all aspects of defects in semiconductors, including point, line, planar and volume defects. The latest advances in defect analysis will be discussed. The conference provides an international forum to present and discuss the correlation between crystal defects, device fabrication and degradation.
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