IWUMD 2025
We are represented with several contributions at the 8th International Workshop on Ultra-Wide Bandgap Materials and Devices.
- Unravelling carrier distribution in AIGaN far-UVC LEDs by temperature dependent electroluminescence measurements
- Precise determination of layer thickness and monitoring of surface roughness by in-situ metrology during MOVPE of deep UV LED structures
- Causes of the inverse correlation between emission power and lifetime of far-UVC LEDs
- Influence of active region growth conditions on the performance of far-UVC light emitting diodes
You will find more information on the conference website.