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Suchergebnisse 1741 bis 1750 von 5247

Compact Stacked Rugged GaN Low-Noise Amplifier MMIC under Input Power Overdrive Condition

/forschung/publikationen/compact-stacked-rugged-gan-low-noise-amplifier-mmic-under-input-power-overdrive-condition

Rugged GaN HEMT LNAs are well established in the receive path of T/R front ends. In order to further enhance the ruggedness against high input powers, stacked transistors can be used in the first…

Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz

/forschung/publikationen/interlaboratory-investigation-of-on-wafer-s-parameter-measurements-from-110-ghz-to-11-thz

This paper presents an interlaboratory comparison of on-wafer S-parameter measurements of coplanar waveguide (CPW) devices in the frequency range of 110 GHz to 1.1 THz. The comparison was…

Common-Gate LNA MMIC With Switching Feature Using GaN-HEMT for 5G RF Front-End

/forschung/publikationen/common-gate-lna-mmic-with-switching-feature-using-gan-hemt-for-5g-rf-front-end

This letter presents a novel three-stage gallium nitride (GaN)-HEMT low-noise amplifier (LNA) with an integrated switch. It is intended to replace the combination of the antenna switch and the LNA,…

Precise Modeling of Coplanar Device Measurements Under Realistic Conditions up to G-Band

/forschung/publikationen/precise-modeling-of-coplanar-device-measurements-under-realistic-conditions-up-to-g-band

Coplanar devices are being used in many new applications, from next-generation (6G) wireless communication systems to autonomous driving and radar sensors. Often they are the building blocks of…

Pursuing innovative approaches for AM applications, based on latest progress in direct diode technology, e.g. 780 nm for aluminum processing

/forschung/publikationen/pursuing-innovative-approaches-for-am-applications-based-on-latest-progress-in-direct-diode-technology-eg-780-nm-for-aluminum-processing

Pursuing innovative approaches for AM applications, based on latest progress in direct diode technology, e.g. 780 nm for aluminum processing H. Alder1, U. Elliesen1, A. Knaub1,…

Effective Separation of Raman Signals from Fluorescence Interference in Undyed and Dyed Textiles Using Shifted Excitation Raman Difference Spectroscopy (SERDS)

/forschung/publikationen/effective-separation-of-raman-signals-from-fluorescence-interference-in-undyed-and-dyed-textiles-using-shifted-excitation-raman-difference-spectroscopy-serds

Textiles are an integral part of our everyday lives, e.g., in the form of clothing and furniture. Consequently, their analysis is of great interest in a wide range of application areas including…

Shifted excitation Raman difference spectroscopy for soil component identification and soil carbonate determination in the presence of strong fluorescence interference

/forschung/publikationen/shifted-excitation-raman-difference-spectroscopy-for-soil-component-identification-and-soil-carbonate-determination-in-the-presence-of-strong-fluorescence-interference

Detailed knowledge about soil composition is an important prerequisite for many applications, for example precision agriculture. Current standard laboratory methods are complex and time-consuming but…

Highly Robust GaN Power Amplifier at Millimeter-Wave Frequencies Using Sputtered Iridium Gate MMIC Technology

/forschung/publikationen/highly-robust-gan-power-amplifier-at-millimeter-wave-frequencies-using-sputtered-iridium-gate-mmic-technology

This article presents the application of FBH’s sputtered Iridium (Ir) gate technology for the design and realization of a highly robust power amplifier (PA) intended for satellite communication…

Thermal lens engineering for high brightness edge emitters

/forschung/publikationen/thermal-lens-engineering-for-high-brightness-edge-emitters

We review approaches for the manipulation (flattening) of thermal profiles within broad-area-lasers for improved efficiency and brightness, illustrated with 1-cm wide, kW-class, 9xx-nm bars.…

Comparison of the static characteristics of GaN HEMTs with different gate technologies and the impact on modeling

/forschung/publikationen/comparison-of-the-static-characteristics-of-gan-hemts-with-different-gate-technologies-and-the-impact-on-modeling

This paper comprehensively studies the impact of different gate technologies on the static characteristics of GaN-HEMTs by comparing three transistors: 1) a GaN-on-SiC transistor fabricated by…