Dual-Wavelength Y-Branch Distributed Bragg Reflector Diode Laser at 785 Nanometers for Shifted Excitation Raman Difference Spectroscopy

M. Maiwald , B. Eppich, J. Fricke, A. Ginolas, F. Bugge, B. Sumpf, G. Erbert, G. Tränkle

Published in:

Appl. Spectrosc., vol. 68, no. 8, pp. 838-843 (2014).

© 2014 Society for Applied Spectroscopy. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the Society for Applied Spectroscopy.


A dual-wavelength Y-branch distributed Bragg reflector (DBR) diode laser at 785 nm is presented as an excitation light source for shifted excitation Raman difference spectroscopy (SERDS). The monolithic device was realized with deeply etched surface DBR gratings using one-step epitaxy. An optical output power of 140 mW was obtained in continuous-wave (CW) operation for each laser cavity, with emission wavelengths of the device at 784.50 and 785.12 nm. A spectral width of the laser emission of 30 pm (0.5 cm-1), including 95% of optical power, was measured. The mean spectral distance of both excitation lines is 0.63 nm (10.2 cm-1) over the whole operating range. Raman experiments using polystyrene as the test sample and ambient light as the interference source were carried out and demonstrate the suitability of the dual-wavelength diode laser for SERDS.

Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany

Index Headings:

Distributed Bragg reflector; DBR diode laser; Raman spectroscopy; Y-branch; 785 nm; Shifted excitation Raman difference spectroscopy; SERDS.