Reliability of high-power 1030 nm DBR tapered diode lasers with different lateral layouts

A. Müller, C. Zink, K. Häusler, B. Sumpf

Published in:

Proc. SPIE 10939, Novel In-Plane Semiconductor Lasers XVIII, Photonics West, San Francisco, USA, Feb 1-6, 109391G (2019).

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