Reliable Operation for 14 500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

B. Sumpf1, M. Maiwald2, A. Müller3, A. Ginolas1, K. Häusler1, G. Erbert1, and G. Tränkle1

Published in:

IEEE Trans. Compon. Packag. Technol., vol. 2, no. 1, pp. 116-121 (2012).

© Copyright 2012 IEEE - All Rights Reserved. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.


Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm × 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 °C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.

1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
2 Department of Chemistry/Physical Chemistry, University of Potsdam, Potsdam 14476, Germany
3 Department of Photonics Engineering, Technical University of Denmark, Roskilde 4000, Denmark

Index Terms:

High-power lasers, laser resonators, Raman spectroscopy, reliability, semiconductor lasers.