SPIE Photonics West 2026
Auch in diesem Jahr ist das FBH wieder auf SPIE Photonics West vertreten. Wir freuen uns auf Ihren Besuch im German Pavillion am Messestand 4205-14.
Darüber hinaus beteiligt sich unser Team mit zahlreichen Beiträgen am Konferenzprogramm:
18.01.2026
- Longitudinal current profile modification for higher brightness in GaAs-based high-power diode lasers
- Micro-integrated light control units for optical fiber length stabilization in strontium-based optical atomic clocks
- Brightness and efficiency scaling of a 1 kW direct diode laser module emitting at 780 nm for additive manufacturing of aluminium
19.01.2026
- Perspectives on the performance scaling of high-power diode laser pumps for use in Inertial Fusion Energy Systems (Invited Paper)
- Ultra-compact optical isolators for micro-integrated photonic modules
- High-quality Al(Ga)N templates and their influence on UV LED performance (Invited Paper)
- Shifted excitation Raman difference spectroscopy: a key tool for real-world applications (Invited Paper)
20.01.2026
- Semiconductor master-oscillator power-amplifier emitting 4 W at 785 nm
- Nonlinear quantum interferometer: generating and sensing mid-infrared radiation for cancer diagnostics
- Monolithic Y-branch DBR diode laser with emission at 633 nm as excitation light source for Raman and SERDS investigations
- Miniaturized 619 nm laser modules with wavelength stabilization via VBGs and FBGs
21.01.2026
- Dual-wavelength diode lasers for SERDS as enabling light sources to improve Raman spectroscopy (Invited Paper)
- Dual-wavelength diode lasers for background-free Raman spectroscopic measurements
- Experimental maximum in type-0 colinear SPDC in ppKTP for varying focusing conditions
- Molecule-specific soil analysis using shifted excitation Raman difference spectroscopy: from laboratory investigations towards field deployment of portable sensors
- Long-term stable single mode AlInGaN laser diodes by overcoming degradation mechanisms
- Building a micro-integrated laser module with fiber coupling at 720 nm: design, simulation, and verification
Weitere Informationen finden Sie im Konferenzprogramm.