UV LED reliability: degradation mechanisms and challenges
M. Meneghini1, F. Piva1, C. De Santi1, N. Trivellin1,2, M. Buffolo1, N. Roccato1, R. Brescancin1, M. Grigoletto1, D. Fiorimonte2, S. Einfeldt3, J. Glaab3, J. Ruschel3, N. Susilo4, T. Wernicke4, M. Kneissl3,4, G. Meneghesso1, E. Zanoni1
Published in:
Proc. of SPIE, vol. 12001, Gallium Nitride Materials and Devices XVII, Photonics West, Hybrid Event, San Francisco, USA, Jan 22-27, 120010B (2022).
1 Dipartimento di Ingegneria dell’Informazione, Università di Padova, via Gradenigo 6/B, Padova 35131, Italy
2 Dipartimento di Ingegneria Industriale, Università di Padova, via Gradenigo 6/B, Padova 35131, Italy
3 Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
4 Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin, Germany
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