J. Hirsch, M. Bursy, M. Gärtner, S. Gerken, N. Goossen-Schmidt, J. Hamperl, S. Hariharan, S. Kubitza, M. Müller, N. Müller, M. Schiemangk, C. Tyborski, D. Zou, and A. Wicht

Published in:

Proc. of SPIE, vol. 12912, Quantum Sensing, Imaging, and Precision Metrology II, Photonics West, San Francisco, USA, Jan 27 - Feb 1, 129120B (2024).

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