Direktlink:

  1. Ferdinand-Braun-Institut
  2. Forschung
  3. Publikationen
  4. Degradation model analysis of ...

Publikationen

Konferenzbeiträge - bei Terminen
Eine Reihe von Hochformatbroschüren ist aufrecht angeordnet. Die Cover zeigen Titel und Informationen zu verschiedenen Themen.

Dissertationen
Collage aus mehreren Patentschriften aus verschiedenen Ländern, darunter Deutschland, die USA und Japan. Es werden Informationen wie Aktenzeichen, Anmeldedaten und Patentnummern präsentiert.

Patente

Degradation model analysis of laser diodes

K. Häusler, U. Zeimer, B. Sumpf, G. Erbert, G. Tränkle

Published in:

J. Mater. Sci. - Mater. Electron., vol. 19, no. 1, pp. 160-164 (2008).

Abstract:

Broad area laser diodes were subjected to accelerated aging until most devices failed. Cathodoluminescence images indicate dark spots after gradual degradation and dark lines after sudden failure. The aging curves were analyzed based on recombination enhanced defect generation and the Eyring model. The data were statistically evaluated by log-normal distribution of failure time and by nonlinear mixed-effects of degradation parameters. The reliability is estimated for long term device operation.

1 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

© Springer Science+Business Media, LLC 2008. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the Springer Science+Business Media, LLC 2008.

Full version in pdf-format.