Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress
D. Montia, M. Meneghinia, C. De Santia,b, S. Da Ruosa, G. Meneghessoa, E. Zanonia, J. Glaabc, J. Rassc, S. Einfeldtc, F. Mehnked, J. Enslind, T. Wernicked, M. Kneisslc,d
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Proc. SPIE 10554, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXII, Photonics West, San Francisco, USA, Jan 27 - Feb 01, 1055410 (2018).
a Department of Information Engineering, University of Padova, via Gradenigo 6/B, Padova, 35131, Italy
b Centro Giorgio Levi Cases, University of Padova, Via Marzolo 9, 35131, Padova, Italy
c Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
d Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, EW 6-1, 10623 Berlin, Germany
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