Deep learning based visual inspection of facets and p-sides for efficient quality control of diode lasers
C. Zinka, M. Ekteraia, D. Martina, W. Clemensb, A. Maennelb, K. Mundingerb, L. Richterb,c, P. Crumpa, A. Kniggea
Published in:
Proc. of SPIE, vol. 12403, High-Power Diode Laser Technology XXI, Photonics West, San Francisco, USA, Jan 28 - Feb 3, 124030E (2023).
a Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
b dida Datenschmiede GmbH, Hauptstraße 8, Meisenbach Höfe, 10827 Berlin, Germany
c Zuse Institute Berlin, Takustraße 7, 14195 Berlin, Germany
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