Characterization of Single-Shot Large-Signal Phenomena Using High-Speed Oscilloscopes
A. Liero1, S. Kühn2, O. Bengtsson1, W. Heinrich1
Published in:
Microwave J., vol. 59, no. 08 sup, pp. 20-26 (2016).
Abstract:
The use of fast real-time oscilloscopes allows the recording of single transient events at GHz frequencies in the large signal operation of electronic components. With sampling rates over 100 GS/s, such equipment can be used to detect and store high frequency signals over a wide frequency spectrum. Sampling oscilloscopes that have been used for many years are restricted to periodic signals, e.g., with active harmonic pull. This article describes how real-time oscilloscopes can be used to capture single transient events that occur during device failure.
1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, 12489 Berlin, Germany
2 Phasor Instruments, 12489 Berlin, Germany
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