Capture Time as a Limit to Pulsed Power in 940 nm Broad Area Diode Lasers
A. Boni, H. Wenzel and P. Crump
Published in:
IEEE Photonics Conference (IPC 2022), Vancouver, Canada, Nov. 13-17, ISBN 978-1-6654-3487-4 (2022).
Abstract:
Measurement and simulation of 940 nm lasers with strongly varied confinement factor in the quantum well are presented. The observed power saturation is little affected by confinement, instead being reproduced when a finite ∼ 5 ps capture time is allowed for.
Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, D-12489 Berlin, Germany
Keywords:
diode laser, high power, high efficiency, ETAS, power saturation, capture-escape process, gain compression, LSHB
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