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Patente

A New Multiport Measurement-Method Using a Two-Port Network Analyzer

F. Lenk, R. Doerner

Published in:

IEEE MTT-S Int. Microw. Symp. Dig., Long Beach, USA, Jun. 17, ISBN 0-7803-8845-3, pp. 1663-1666 (2005).

Abstract:

A new method is presented how to characterize multiport devices using a two-port vector network-analyzer (VNA). Up to now, at least one of the port terminations had to be fully known to measure the S-parameters of the device. Our new measurement method overcomes this restriction. All of the device parameters and all of the port terminations are calculated from the device measurements.

Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

Index Terms:

Multiport circuits, Millimeter wave measurements, Measurement errors, Scattering parameters measurement.

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