CS Mantech 2026
Das FBH beteiligt sich mit mehreren Beiträgen an der diesjährigen International Conference on Compound Semiconductor Manufacturing Technology.
- Time resolved Raman thermography of GaN-on Diamond HEMTs
- High-Temperature Passivation for Improved Reliability of AlGaN/GaN HEMTs
- Precise determination of layer thickness, ternary composition and surface roughness by in-situ metrology during MOVPE of deep UV LED structures
- Reliable 2D Characterization of Al-GaN Barrier Thickness and Composition of E-Mode GaN-on-Si HEMT Wafers for Yield Prediction
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