The impact of external optical feedback on the degradation behavior of high-power diode lasers

M. Hempela, M. Chib, P.M. Petersenb, U. Zeimerc, M. Weyersc, and J.W. Tomma

Published in:

Proc. SPIE, vol. 8605, Photonics West, High-Power Diode Laser Technology and Applications XI, San Francisco, USA, Feb. 02-07, 86050L (2013).

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Abstract:

The impact of external feedback on high-power diode laser degradation is studied. For this purpose early stages of gradual degradation are prepared by accelerated aging of 808-nm-emitting AlGaAs-based devices. While the quantum well that actually experiences the highest total optical load remains unaffected, severe impact is observed to the cladding layers and the waveguide. Consequently hardening of diode lasers for operation under external optical feedback must necessarily involve claddings and waveguide, into which the quantum well is embedded.

a Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Str. 2 A, 12489 Berlin, Germany
b DTU Fotonik, Department of Photonics Engineering, Technical University of Denmark, Frederiksborgvej 399, P.O. Box 49, DK-4000 Roskilde, Denmark
c Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany

Keywords:

diode laser, external feedback, reliability, AlGaAs