Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty
IEEE Trans. Microwave Theory Tech., vol. 61, no. 10, pp. 3800-3807 (2013).
© Copyright 2013 IEEE - All Rights Reserved. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
A new method for the sensitivity analysis of -parameter measurements due to the uncertainty of the calibration standards is presented. It is a fully analytic, straightforward calculation and can be applied to any analytic calibration routine. As a result, simple equations for the sensitivity coefficients are obtained, thus providing an in-depth view into the error propagation mechanisms. In contrast to numericalmethods, general findings independent from the particular measurement setup or frequency setting are possible. The method is demonstrated for one-port calibration and for two-port calibration with the common thru-reflect-match and thru-reflect-line calibration procedures, as well as for their nonzero-length thru extensions line-reflect-match and line-reflectline, respectively.
1 Brandenburg Technical University, D-03013 Cottbus, Germany
2 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
3 Cascade Microtech GmbH, D-01561 Thiendorf, Germany
Calibration standards, microwave measurements, sensitivity coefficients, S-parameters, uncertainty of measurement, vector network analyzer (VNA), VNA calibration.