Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty

F. Lenk1, R. Doerner2, A. Rumiantsev1,3

Published in:

IEEE Trans. Microwave Theory Tech., vol. 61, no. 10, pp. 3800-3807 (2013).

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A new method for the sensitivity analysis of -parameter measurements due to the uncertainty of the calibration standards is presented. It is a fully analytic, straightforward calculation and can be applied to any analytic calibration routine. As a result, simple equations for the sensitivity coefficients are obtained, thus providing an in-depth view into the error propagation mechanisms. In contrast to numericalmethods, general findings independent from the particular measurement setup or frequency setting are possible. The method is demonstrated for one-port calibration and for two-port calibration with the common thru-reflect-match and thru-reflect-line calibration procedures, as well as for their nonzero-length thru extensions line-reflect-match and line-reflectline, respectively.

1 Brandenburg Technical University, D-03013 Cottbus, Germany
2 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
3 Cascade Microtech GmbH, D-01561 Thiendorf, Germany

Index Terms:

Calibration standards, microwave measurements, sensitivity coefficients, S-parameters, uncertainty of measurement, vector network analyzer (VNA), VNA calibration.