A Novel Load-Pull Setup with Envelope Calibration for Bias Modulated Measurements
O. Bengtsson*, L. Vestling**, J. Olsson**
Published in:
European Microwave Conf. (EuMC 2009), Rome, Italy, Sep. 29 - Oct. 01, pp. 942-945 (2009).
Abstract:
In this paper a measurement system for evaluation of RF-Power transistors in high-efficiency operation using drain bias-modulation is presented. The system is based on a novel 2- tone load-pull measurements configuration with envelope synchronized dynamic bias modulation. For the bias modulation a dynamic power analyzer for DC-low frequency power source and monitoring is used. A predicted 10-15 % efficiency enhancement in the backed of region for the studied LDMOS has been verified with the narrow bandwidth system. System calibration includes a general peak-power envelope synchronization method that is possible to use also in wider bandwidth systems. I.
* Now with Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
** Uppsala University, The Ångström Laboratory, Solid State Electronics, P.O. Box 534, Uppsala, SE-751 21, Sweden
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