Visualization of heat flows in high-power diode lasers by lock-in thermography
M. Ziegler1, J.W. Tomm1, T. Elsaesser1, G. Erbert2, F. Bugge2, W. Nakwaski3, and R.P. Sarzala3
Published in:
Appl. Phys. Lett., vol. 92, no. 103513 (2008).
Abstract:
Lock-in thermography is applied to analyze thermal properties of high-power diode lasers. With a temporal resolution of about 100 µs for thermal imaging of the entire device, microscopic heat flows occurring on a millisecond time scale and propagating infrared light are distinguished. This allows for a measurement of heat transport in the device on a 100 µm length scale and an identification of "hot spots" at the device edges as scattered thermal radiation. Thermal transients are monitored and described quantitatively by finite element modeling. Thermographic images of the laser side identify the front facet as a major heat source.
1 Max-Born-Institut, Max-Born-Str. 2 A, 12489 Berlin, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
3 Laboratory of Computer Physics, Institute of Physics, Technical University of Lódz, ul. Wólczanska 219, 93-005 Lódz, Poland
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