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Patente

Temporally Resolved Impedance Measurement of Differential, RF-Powered Devices using the Example of a µWave RFID Front-End

C. Bansleben1, S. Kühn2 , N. Gay1, W.-J. Fischer1

Published in:

IEEE MTT-S Int. Microw. Symp. Dig., Anaheim, CA, May 25-27, pp. 852-855 (2010).

Abstract:

This work was motivated by the idea to monitor the input impedance of differential front-ends of passive RFIDtransponders depending on their power-consumption. Different methods readily available in state-of-the-art network analyzers are compared with regard to the special demands imposed by passive RFID front-ends. At this the correct stimulation of the DUT appears to be the major issue of conventional methods. Hereupon a new approach is proposed which for the first time combines the proper stimulation of differential, RF-powered devices with the data aquisition of differential mixed-mode S-parameters in temporal resolution. The new measurement method is applied to a 2.45GHz RFID transponder showing detailed mixed-mode results of its power-up behavior.

1 Fraunhofer Institute for Photonic Microsystems (IPMS), Dresden, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

Keywords:

Scattering parameters measurement, differential analyzers, integrated circuit testing, microwave measurement, multiport circuits, network testing

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