Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations
F.J. Schmückle1, R. Doerner1, G.N. Phung1, W. Heinrich1, D. Williams2, U. Arz3
Published in:
European Microwave Conf. (EuMC 2011), Manchester, UK, Oct. 10-13, pp. 297-300 (2011).
Abstract:
We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and their impact on vector-network-analyzer calibrations at W-band.
1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
2 National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, CO 80305, USA
3 Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany
Keywords:
calibration, CPW, em simulation, on-wafer, measurements.
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