Publikationen

On the Gunn Effect in GaAs HBTs

M. Rudolph, R. Doerner, P. Heymann

Published in:

IEEE MTT-S Int. Microwave Symp. Dig., vol. 2, pp. 683-686 (2001).

Abstract:

A negative RF-resistance effect in GaAs HBTs is described. It results from the nonlinear velocity-field characteristic in GaAs, takes place in the bulk collector, and leads to |S22| exceeding unity. Dependence on bias point and collector doping, and consequences for modeling are discussed.

Ferdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, 12489 Berlin, Germany

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