Investigations on Operational Reliability of 808 nm QCW Laser Diode Half-Bars for Space-Borne Applications
K. Häusler, C. Stölmacker, A. Maaßdorf, P. Ressel, R. Staske, G. Tränkle and P. Crump
Published in:
27th International Semiconductor Laser Conference (ISLC), Potsdam, Germany, Oct. 10-14, ISBN 978-1-6654-4133-9, TuP2.4 (2021).
Abstract:
Laser diode half-bars with 16 emitters were manufactured and qualified for pulsed high-power operation on the satellite MERLIN. Stress accelerated life tests of 20 laser half-bars were performed for 5·109 shots. No single emitter failure was detected resulting in 99.99% reliability over mission lifetime.
Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, 12489 Berlin, Germany
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