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Patente

Imaging Catastrophic Optical Mirror Damage in High-Power Diode Lasers

M. Ziegler1, J.W. Tomm1, U. Zeimer2, and T. Elsaesser1

Published in:

J. Electron. Mater., vol. 39, no. 6, pp. 709-714 (2010).

Abstract:

We image catastrophic optical mirror damage (COMD) in red- and infraredemitting high-power broad-area diode lasers by combining highly COMD-selective thermography, near-field imaging, scanning electron microscopy, and cathodoluminescence. All techniques exhibit strong correlations in terms of COMD location and strength and allow for an unambiguous decision about COMD occurrence. In particular, temperatures en route to and during COMD are measured, and the concept of a critical facet temperature that induces thermal runaway is supported.

1 Max-Born-Institut, Max-Born-Str. 2 A, 12489 Berlin, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

Keywords:

High-power diode lasers, catastrophic optical mirror damage, laser degradation, thermography

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