Gradual degradation of red-emitting high-power diode laser bars
M. Zieglera, T.Q. Tiena, S. Schwirzke-Schaafa, J.W. Tomma, B. Sumpfb, G. Erbertb, M. Oudartc, J. Nagled
Published in:
Appl. Phys. Lett., vol. 90, no. 171113 (2007).
Abstract:
The authors analyze early stages of gradual degradation in highly reliable 650 nm emitting high-power diode laser arrays with continuous wave emission powers of 2.5 W (facet load of 4 mW/µm). In all cases the edges of the metallized emitter stripes are identified as the starting points of gradual degradation. The magnitude of the observed degradation signatures, however, is highly correlated with the bar-specific packaging-induced strain at each emitter. We find a bar-specific effect, namely, the presence of packaging-induced strain, to be the driving force of gradual degradation. Our findings point to the significance of proper strain management in advanced device structures.
a Max-Born-Institut, Max-Born-Str. 2 A, 12489 Berlin, Germany
b Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
c Alcatel Thales III-V Laboratory, RD128, 91767 Palaiseau Cedex, France
d Thales Research and Technology, RD128, 91767 Palaiseau Cedex, France
© 2007 American Institute of Physics. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the American Institute of Physics.
Full version in pdf-format.