Correction of picosecond voltage pulses measured with external electro-optic sampling tips
S. Seitz1, M. Bieler1, G. Hein1, K. Pierz1, U. Siegner1, F.-J. Schmückle2, and W. Heinrich2
Published in:
Meas. Sci. Technol., vol. 18, no. 5, pp. 1353-1360 (2007).
Abstract:
We quantify the distortion that an external electro-optic sampling tip imprints on a measured picosecond voltage pulse propagating on a coplanar stripline. In order to characterize the sampling tip, we take advantage of the electro-optic effect of the GaAs substrate onto which the stripline is fabricated. In these measurements, the electro-optic tip just acts as a disturbance of the transmission line. We derive a correction function that allows us to eliminate the influence of the invasive sampling tip on a measured voltage pulse up to a frequency of 400 GHz. The corrected voltage pulse shows good agreement with the true, undisturbed voltage pulse obtained from a sampling measurement using the electro-optic effect of the GaAs substrate. Moreover, the experimental results are supported by finite-difference frequency-domain simulations. Our work paves the way towards a more accurate characterization of high-speed electronic devices using external electro-optic sampling tips.
1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Keywords:
picosecond voltage pulse, time-domain measurement, electro-optic sampling, coplanar transmission lines, invasiveness, signal correction.
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