Compact HBT modeling: status and challenges
Published in:
IEEE MTT-S Int. Microw. Symp. Dig., Anaheim, CA, May 25-27, pp. 1206-1209 (2010).
Abstract:
HBTs show much better performance compared to their BJT predecessors, but also require enhanced models for reliable circuit design. This talk addresses which enhancements are required and available in state-of-the-art models, namely, accounting for self-heating and bias-dependence of transit-time. Limitations of these models, and thus challenges for future modeling efforts, will also be addressed, like: modeling of large and packaged devices, noise modeling, operation in deep saturation, and operation at and beyond transit frequency.
1 Ulrich L. Rohde Chair of RF and Microwave Techniques, Siemens-Halske-Ring 14, 03046 Cottbus, Germany
2 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
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