Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation
M. Ziegler1, J.W. Tomm1, D. Reeber1, T. Elsaesser1, U. Zeimer2, H.E. Larsen3, P.M. Petersen3, and P.E. Andersen3
Published in:
Appl. Phys. Lett., vol. 94, no. 191101 (2009).
Abstract:
Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a "thermal flash". A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
1 Max-Born-Institut, Max-Born-Str. 2 A, 12489 Berlin, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
3 Department of Photonics Engineering, DTU Fotonik, Technical University of Denmark, Risø campus Building 128, P.O. Box 49, 4000 Roskilde, Denmark
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