Calibration residual error propagation analysis using conformal mapping
F. Lenk1, R. Doerner2 , A. Rumiantsev3, M. Rudolph4
Published in:
77th ARFTG Microwave Measurement Conference (ARFTG), Baltimore, USA, Jun. 10 (2011).
Abstract:
In this paper a new method is introduced for analyzing the error propagation when calibrating a vector network analyzer (VNA) with non-ideal calibration elements ("standards"). The underlying equations are perceived as a conformal mapping from the calibration element plane to the calculated S-parameter. With this approach a deep insight of the error propagation is possible.
The method can be applied to other measurement problems to evaluate complex uncertainties, as long as the mathematical relationship between measurement data and calculated values forms a linear fractional transformation.
1 Hochschule Lausitz (FH), Großenhainer Str. 57, D-01968 Senftenberg, Germany
2 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Strasse 4, 12489 Berlin, Germany
3 Cascade Microtech Dresden GmbH, Süss-Str. 1, D-01561 Sacka, Germany
4 Brandenburg University of Technology, Siemens-Halske-Ring 14, D-03046 Cottbus, Germany
Index Terms:
Calibration, error analysis, scattering parameters, conformal mapping, measurement uncertainty.
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