Power Electronics Department

Our Power Electronics Department researches and develops special measurement techniques and simulation methods for power transistors. This includes dynamic characterization techniques, various simulation tools (physically oriented, as well as thermal and mechanical device simulation), and reliability analyses.

Our focus

  • Device simulations: physically oriented as well as thermal and mechanical
  • Device characterization: comprehensive characterization of dynamic properties including heat distribution over extended power transistors and their thermal impedance
  • Reliability analysis with customized test routines
Setup for microwave life-time testing