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Imaging Catastrophic Optical Mirror Damage in High-Power Diode Lasers
M. Ziegler1, J.W. Tomm1, U. Zeimer2, and T. Elsaesser1
1 Max-Born-Institut, Max-Born-Str. 2 A, 12489 Berlin, Germany
2 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
Published in:
J. Electron. Mater., vol. 39, no. 6, pp. 709-714 (2010).
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Abstract:
We image catastrophic optical mirror damage (COMD) in red- and infraredemitting
high-power broad-area diode lasers by combining highly COMD-selective
thermography, near-field imaging, scanning electron microscopy,
and cathodoluminescence. All techniques exhibit strong correlations in terms
of COMD location and strength and allow for an unambiguous decision about
COMD occurrence. In particular, temperatures en route to and during COMD
are measured, and the concept of a critical facet temperature that induces
thermal runaway is supported.
Key words:
High-power diode lasers, catastrophic optical mirror damage, laser degradation, thermography
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