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AlGaN/GaN HEMT With Integrated Recessed Schottky-Drain Protection Diode
E. Bahat-Treidel, R. Lossy, J. Würfl, and G. Tränkle
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
Published in:
IEEE Electron Device Lett., vol. 30, no. 9, pp. 901-903 (2009).
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Abstract:
We present an AlGaN/GaN high-electron mobility
transistor (HEMT) with an integrated recessed protection diode
on the drain side of the transistor channel. Results from our
Schottky-drain HEMT demonstrate an excellent reverse blocking
with minor tradeoff in the ON-state resistance for the complete
device. The excellent quality of the forward diode characteristics
indicates high robustness of the recess process. The reverse blocking
capability of the diode is better than -110 V. Physical-based
device simulations give an insight in the respective electronic
mechanisms. This is the first time that a recessed Schottky-drain
diode integrated in a HEMT device is presented.
Index Terms:
AlGaN/GaN high-electron mobility transistor
(HEMT), protection diode, recessed Schottky-drain diode
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