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High Yield, Highly Scalable, High Voltage GaInP/GaAs HBT Technology
P. Kurpas, B. Janke, A. Wentzel, H. Weiss*, L. Schmidt*, C. Rheinfelder*, R. Pazirandeh, A. Maaßdorf, L. Schellhase, W. Heinrich, J. Würfl
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
* Ubidyne GmbH, Lise-Meitner-Strasse 14, 89081 Ulm, Germany
Published in:
Int. Conf. on Compound Semiconductor Manufacturing Technology (CS ManTech 2008), Chicago, IL, Apr. 14-17, pp. 115-118 (2008).
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Abstract:
Based on a power high-voltage (HV) HBT technology
the successful down scaling towards low-power devices
for mixed signal integrated circuits is described. Stress
effects and mechanical stability issues required
processing adaptations. High yields of 99.8 % for 3x30 µm2
and 99.0 % for 2x10 µm2 HV-HBTs were achieved.
This allows for fabrication of complex integrated circuits
with several hundreds of transistors monolithically
combining power and digital circuit parts.
Keywords:
GaInP/GaAs HBT, power HBT, mixed signal digital circuits, yield
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