Direct Extraction of HBT Equivalent-Circuit Elements
M. Rudolph,
R. Doerner, P. Heymann
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, D-12489 Berlin, Germany
Published in:
IEEE Trans. Microwave Theory Tech., vol. 47, no. 1, pp. 82-84 (1999).
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Abstract:
We present an analytical method for determining the heterojunction bipolar transistors (HBT's)
equivalent-circuit elements. Its special feature is that it does not need measurements of test
structures nor optimizations. The new algorithm for extracting the intrinsic elements exploits
the information contained in the frequency dependence of the network parameters. This leads to a
fast algorithm with a unique solution. The method is validated treating GaInP-GaAs HBT's
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