A New Multiport Measurement-Method Using a Two-Port Network Analyzer

F. Lenk, R. Doerner

Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

Published in:
IEEE MTT-S Int. Microwave Symp. Dig., 2005.
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Abstract:
A new method is presented how to characterize multiport devices using a two-port vector network-analyzer (VNA). Up to now, at least one of the port terminations had to be fully known to measure the S-parameters of the device. Our new measurement method overcomes this restriction. All of the device parameters and all of the port terminations are calculated from the device measurements.

Index Terms:
Multiport circuits, Millimeter wave measurements, Measurement errors, Scattering parameters measurement.

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