Determination of longitudinal and transversal shifts of three-dimensional Gaussian beams reflected at a grating near an anomaly
R. Güthera, B.H. Kleemannb, J. Elschnerc, G. Schmidtc
aFerdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, D-12489 Berlin, Germany
bCarl Zeiss, D-73446 Oberkochen, Germany
cWeierstraß-Institut für Angewandte Analysis und Stochastik, Mohrenstr. 39, D-10117 Berlin, Germany
Published in:
Journal of Modern Optics, vol. 49, no. 11, pp. 1785-1793 (2002)
© 2002 Taylor & Francis Ltd.
Abstract:
Spatial displacements of three-dimensional Gaussian beams diffracted at a reflection grating are
studied theoretically and numerically. The complex diffraction coefficients (amplitudes and phases)
of the grating diffracted plane waves calculated by a rigorous method for conical diffraction are
the basis for this investigation. The classical analytical formula for the longitudinal shift
depending on the gradient of the reflection phase is generalized to the simultaneous analytical
treatment of the longitudinal Goos-Hänchen as well as transverse shift. A second method uses
the full integration on the whole spectrum of plane waves of the diffracted beam.