 |
Influence of oxygen in AlGaAs-based laser structures with Al-free active region on device properties
A. Knauer,
H. Wenzel, G. Erbert, B. Sumpf, M. Weyers
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, 12489 Berlin, Germany
Published in:
J. Electron. Mater., vol. 30, no. 11, pp. 1421-1424 (2001).
© Springer International Publishing AG, Part of Springer Science+Business Media. Personal use of this material is permitted. However, permission to reprint/republish this material for
advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists,
or to reuse any copyrighted component of this work in other works must be obtained from the Springer International Publishing AG, Part of Springer Science+Business Media.

Abstract:
AlGaAs-based lasers with GaAsP active regions for emission wavelengths near 730nm and
800nm were studied. Trimethyl aluminium sources with different levels of oxygen
concentration were used for the deposition of the laser structures. The laser data show,
that the oxygen level in the AlGaAs waveguides is very critical for the performance of
the 730nm devices even for the use of an Al-free active region, while its influence is
weak for the 800nm devices. Using the TMAl source leading to the lowest O-uptake in the
AlGaAs waveguides from such structures 7W output power and a degradation rate of 1×10-5h-1
at 2W cw (100µm stripe width × 4mm, 25°C, 2000h) are achieved for 730nm emission.
Keywords:
GaAsP, AlGaAs, oxygen, metalorganic vapor phase epitaxy (MOVPE), quantum wells (QW), laser diodes
Full version in pdf-format.
|
|