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High-Power Highly Reliable Al-Free 940-nm Diode Lasers
G. Erbert,
G. Beister, R. Hülsewede, A. Knauer, W. Pittroff, J. Sebastian, H. Wenzel, M. Weyers, G. Tränkle
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, 12489 Berlin, Germany
Published in:
IEEE J. Sel. Top. Quantum Electron., vol. 7, no. 2, pp. 143-148 (2001).
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Abstract:
Al-free diode lasers emitting at 940 nm having a broadened step-index waveguide structure
and a single active InGaAs quantum well have been realized by MOVPE. The impact of waveguide
thickness on device performance has been studied. The highest wall plug efficiency of
about 60% has been obtained with diode lasers having a 1-µm-thick waveguide. Increasing
the waveguide thickness to 1.5 µm resulted in record low degradation rates below
10-5 h-1 for 3-W output power (100 µm stripe width). The same diode
lasers showed a good long-term reliability even at an output power of 4 W. The best beam
quality had diode lasers with a 2-µm-thick waveguide, at the expense of a reduced
temperature stability.
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