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Theory and Measurements of Flip-Chip interconnects for frequencies up to 100 GHz
A. Jentzsch,
W. Heinrich
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Albert-Einstein-Straße 11, 12489 Berlin, Germany
Published in:
IEEE Trans. Microwave Theory Tech., vol. 49, no. 5, pp. 871-878 (2001).
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Abstract:
A detailed investigation of flip-chip interconnects up to W-band frequencies is presented
in this paper. In a coplanar 50-Ohm-environment, different test structures were fabricated
and measured to determine the electromagnetic characteristics of flip-chip multichip
modules, such as detuning, reflection at the interconnect, and parasitic coupling.
Electromagnetic simulation is used to explain the details behind the measured results.
Key to high return loss at the interconnect is a small bump-pad area. Applying simple
compensation structures, the frequency range of operation can be further extended. It is
shown that a return loss beyond 20 dB in the frequency range up to 80 GHz is achievable
along with excellent reproducibility. Measurements on detuning and isolation are also
presented.
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